Test Development

ASIP provides complete Test solution for all DFT scenarios, including development and conversion of Test Content, Pattern optimization, Test time reduction, Failure & Yield Analysis meeting the Test cost, Yield & DPM requirements over the Product life time.

    • Test Content development
    • Test Program conversion
    • Load Board/Probe Card design
    • Test Socket/Accessory design
    • Tester EDA & Tooling support